Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4640201 | Journal of Computational and Applied Mathematics | 2010 | 8 Pages |
Abstract
Recently we introduced a new method which we call the Extended Sampling Method to compute the eigenvalues of second order Sturm–Liouville problems with eigenvalue dependent potential. We shall see in this paper how we use this method to compute the eigenvalues of fourth order Sturm–Liouville problems and present its practical use on a few examples.
Keywords
Related Topics
Physical Sciences and Engineering
Mathematics
Applied Mathematics
Authors
Bilal Chanane,