Article ID Journal Published Year Pages File Type
4640201 Journal of Computational and Applied Mathematics 2010 8 Pages PDF
Abstract

Recently we introduced a new method which we call the Extended Sampling Method to compute the eigenvalues of second order Sturm–Liouville problems with eigenvalue dependent potential. We shall see in this paper how we use this method to compute the eigenvalues of fourth order Sturm–Liouville problems and present its practical use on a few examples.

Related Topics
Physical Sciences and Engineering Mathematics Applied Mathematics
Authors
,