Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4676398 | Cold Regions Science and Technology | 2009 | 9 Pages |
Abstract
Compression tests are snow stability tests that are widely used by avalanche professionals and snow researchers to identify potential weak snowpack layers. Describing fracture character in addition to the number of taps required to initiate a fracture improves the interpretation of compression test results, since certain types of fractures, i.e. sudden fractures, are more often associated with skier-triggered avalanches. Digital snowpack penetrometers provide high resolution penetration resistance data of the snow cover with depth. The SnowMicroPen (SMP) was used to measure high resolution penetration resistance profiles in the snowpack next to compression tests. A reliable method to automatically detect the snow surface in the SMP signals was introduced. Furthermore, a method based on the autocorrelation of the penetration resistance signal was developed to identify the failure layers, identified using compression tests, in the penetration resistance profiles. Using field data from 190 penetration resistance measurements, each collected between two compression tests, micro-structural parameters associated with different types of fractures were identified. More than 550 fractures were classified as either Progressive Compression (1.3%), Resistant Planar (12.1%), Sudden Planar (50.4%), Sudden Collapse (26.8%) or non-planar Break (9.4%). Measurement and analysis were focussed on micro-structural properties of the failure layer, the layer adjacent to the failure layer and the slab above the failure layer. Sudden collapse fractures were found to have typical micro-structural snowpack parameters that are generally associated with unstable snow conditions, such as large differences in penetration resistance between the failure layer and the adjacent layer.
Related Topics
Physical Sciences and Engineering
Earth and Planetary Sciences
Earth and Planetary Sciences (General)
Authors
Alec van Herwijnen, Sascha Bellaire, Jürg Schweizer,