Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
4700584 | Chemical Geology | 2008 | 9 Pages |
Abstract
A 29Si NMR spectrum with high signal to noise ratio was collected from a well-characterized, isotopically-enriched SiO2 glass with a single scan after full relaxation of the magnetization. From the spectrum, the average Si–O–Si bond angle was estimated at 150° with a minimum fwhm of the bond angle distribution of 16°. The 29Si spin-lattice relaxation times were measured by saturation recovery and differential T1 relaxation was observed for the various Si environments.
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Authors
Wim J. Malfait, Werner E. Halter, Rene Verel,