| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 4910719 | Powder Technology | 2017 | 10 Pages |
Abstract
With the development of appropriate image processing procedures, determination of exposed grain surface area of multiphase particles is now possible from high resolution X-ray tomography data.97
Related Topics
Physical Sciences and Engineering
Chemical Engineering
Chemical Engineering (General)
Authors
Y. Wang, C.L. Lin, J.D. Miller,