The study of cesium ionization at high gas temperature in a primary circuit

A kinetic model has been presented in developing a better understanding of the mechanism behind the ions formation at high gas temperature in a primary circuit in conditions of severe accidents. The formation of ions is triggered by the thermal ionization of cesium atoms and irradiation of a hot steam. The kinetics of ions is considered in combination with the neutral chemistry of cesium and iodine species. Modeling results are presented for temperatures 2000 and 1200 K and a dose rate of 1000 kGy/s. The evolution of the concentrations of the most abundant ions and neutral reaction products are calculated.