Ellipsometric characterization and optical anisotropy of nanostructured CuIn3S5 and CuIn5S8 thin films

In the present work, we prepared CuIn3S5 and CuIn5S8 thin films by Glancing Angle Deposition technique (GLAD). In general, this technique promotes the formation of nanostructures, and in our particular case, it was possible to develop nanorods of these two materials by tilting the substrates with respect to the flux of incident material and heating the substrates with a halogen lamp. The nanorods are inclined in the direction of incident material flux which is no longer in the same direction with the normal to the substrates. (SEM) has led to an optical anisotropy. To ensure this optical anisotropy, we characterized the samples by ellipsometry, at 3 angles of incidence 50°, 60° and 70°. At each angle of incidence, three measurements were made at different azimuth angles 00°, 45° and 90°. These ellipsometric measurements allowed us to reach the right model to determine the refractive index, the thickness of films and the determination of the optical constants of the CuIn3S5 and CuIn5S8 samples, such as the dielectric constant.