Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5006060 | Materials Science in Semiconductor Processing | 2017 | 13 Pages |
Abstract
Here we review a systematic study of the structure-property correlations of a series of defects in CdTe solar cells. A variety of experimental methods, including aberration-corrected scanning transmission electron microscopy, electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, and electron-beam-induced current have been combined with density-functional theory. The research traces the connections between the structures and electrical activities of individual defects including intra-grain partial dislocations, grain boundaries and the CdTe/CdS interface. The interpretations of the physical origin underlying the structure-property correlation provide insights that should further the development of future CdTe solar cells.
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Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
Chen Li, Jonathan Poplawsky, Yanfa Yan, Stephen J. Pennycook,