Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5006067 | Materials Science in Semiconductor Processing | 2017 | 6 Pages |
Abstract
Using of infrared (IR) and photoluminescence (PL) spectroscopy a comparative study of distinctions in composition and photoluminescence properties of porous silicon with different morphology was performed. Basing on the obtained experimental data and conventional theoretical models the main factors were found that have a negative effect on the intensity of PL in porous silicon and its degradation under the impact of directed irradiation in the visible range. With porous silicon as an example having the pores of 50-100Â nm in size there was demonstrated a possibility for improving of these characteristics by its chemical treatment in polyacrylic acid.
Related Topics
Physical Sciences and Engineering
Engineering
Electrical and Electronic Engineering
Authors
A.S. Lenshin, P.V. Seredin, V.M. Kashkarov, D.A. Minakov,