Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5006590 | Measurement | 2017 | 4 Pages |
Abstract
There are growing demands on the evaluation of accuracy for high-speed analog-to-digital converters which are increasingly needed in electrical metrology these days. Here, we have developed a system to measure the linearity error of analog-to-digital converters by adopting a reference sampling voltmeter and a dummy waveform generator. With the measurement setup, we evaluated the linearities for three units of Î-Σ analog-to-digital converter, NI-5922, combined with three different PXI chassis. We found that the maximum linearity error can change with the PXI chassis up to about 15 μV/V.
Related Topics
Physical Sciences and Engineering
Engineering
Control and Systems Engineering
Authors
G.W.C. Wijayasundara, Hyung-Kew Lee, Seung-Nam Park, Hehree Cho, Mun-Seog Kim,