Article ID Journal Published Year Pages File Type
5006590 Measurement 2017 4 Pages PDF
Abstract
There are growing demands on the evaluation of accuracy for high-speed analog-to-digital converters which are increasingly needed in electrical metrology these days. Here, we have developed a system to measure the linearity error of analog-to-digital converters by adopting a reference sampling voltmeter and a dummy waveform generator. With the measurement setup, we evaluated the linearities for three units of Δ-Σ analog-to-digital converter, NI-5922, combined with three different PXI chassis. We found that the maximum linearity error can change with the PXI chassis up to about 15 μV/V.
Related Topics
Physical Sciences and Engineering Engineering Control and Systems Engineering
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