Optical limiting using spatial self-phase modulation in hot atomic sample

In this work, we characterized the performance of optical limiting by self-phase modulation (SPM) in hot atomic vapor cell. The results indicated that the performance of the optical limiter is closely related to the position of the sample cell, which is determined by the Rayleigh lenght of beam. The lowest limiting threshold and clamp output were obtained at the sample position at −10 mm from the coordinate origin (the beam waist). The phenomenon was explained well by the theory of SPM and z-scan, which are caused by both Kerr effect and the thermal optical nonlinear effect. This useful information obtained in the meaning of this work is determining the optimal position of the sample cell in the optical limiter and other applications of SPM.