Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5024901 | Optik - International Journal for Light and Electron Optics | 2017 | 7 Pages |
Abstract
This work aims to characterize the retardation of birefringent samples such as wave-plates and birefringent wedges where the principal axis is uniform over the sample zone. The in-line procedure described and implemented for the purpose uses four frames of intensity data that are digitally recorded and combined to characterize the sample in terms of its retardance from 0 to 2Ï as also to uniquely identify the direction of its fast axis. Simulated and experimental results presented are in good agreement with the proposed theory.
Related Topics
Physical Sciences and Engineering
Engineering
Engineering (General)
Authors
Santa Sircar, Ipsita Chakraborty, Suvanwit Roy, K. Bhattacharya,