Nonlinear refraction in (5,10,15,20-tetraphenylporphyrinato)-copper(II) doped PMMA thin film at wavelength 1064Â nm

(5,10,15,20-Tetraphenylporphyrinato)-copper(II) (TPP-Cu) are synthesized, and characterized by X-ray single crystal diffraction. TPP-Cu doped polymethylmethacrylate (PMMA) thin film on quartz substrate were prepared by spin-coating method. The morphology of the film were investigated by scanning electron microscopy. The nonlinear refractive properties of the film were studied using closed aperture Z-scan technique by picosecond (PS) laser pulses at different irradiance at wavelength 1064 nm. The nonlinear refraction coefficient n2I value of the film were determined to be 1.28 × 10−12 m2/W, this making them ideally suited to the applications in the field of all-optical switches.