Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5025519 | Optik - International Journal for Light and Electron Optics | 2017 | 8 Pages |
Abstract
Since the introduction of the Z-scan, which is widely used to measure the nonlinear optical properties of material. The result of measurement mainly depends on light through the sample after a slight variation in the intensity, and the tiny change depends on the accuracy of the measurement sensitivity of Z-scan technology. Measurement scheme of the optical signal for nonlinear characterization and transmission beam design can improve the sensitivity of Z-scan technique.
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Engineering
Engineering (General)
Authors
Cheng-Bao Yao, Ke-Xin Zhang, Xing Wen,