Study on polarization properties of scattering light from surface of artificial microstructure material with low reflectivity

In order to study the polarization properties of scattering light from surface of artificial microstructure material with low reflectivity, the measurement system of the polarization properties was established by using precision rotating platform, weak light illumination photometer and the laser with wavelength of 532 nm. Representative black silicon and black metal aluminum are selected as the tested samples, polarization properties for different attitudes, different incident angles and different periodicities are measured, and influence of attitude, incident angle and periodicity on the polarization properties is investigated. Experimental results show that, the polarization degree of the two kinds of microstructures enhances with the increase of the incidence angle and presents a certain peak value. By comparison, it is found that the polarization ability of the black metal aluminum is stronger than that of the black silicon. In terms of difference of periodicity for two kinds of microstructure materials, the information presented by polarization can effectively distinguish two kinds of microstructure materials, this provides a certain basis for the identification of low reflectivity materials by polarization method.