Simulation of resolution properties of microchannel plate

To improve the resolution capabilities of MCP, numerical simulation of the MTF of MCP has been made. Solving the electron trajectory equation, we obtain the potential distribution of MCP, and then obtain the electron trajectory in MCP. On this basis, a group of MTF curves are plotted by varying the tilt angle, the channel diameter, and the output end spoiling depth, individually. The simulation results show that in a moderate range a larger the tilt angle, a smaller the channel diameter, and a deeper the output end spoiling depth can improve the resolution of MCP significantly, according to the state of the art. Research on the effect of the above parameters on the resolution properties of MCP will provide a theoretical support for developing MCP with high resolution and further improving the resolution of image intensifiers.