| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5060042 | Economics Letters | 2012 | 4 Pages |
Abstract
Using US manufacturing industry data, we re-examine evidence of first- and second-generation models of R&D-based endogenous growth focusing on innovation (patent) quality. We show that Schumpeterian growth theories perform better than semi-endogenous growth models.
⺠Innovation (patent) counts support first-generation Schumpeterian growth theory. ⺠Quality-adjusted innovation data support second-generation Schumpeterian theory. ⺠Findings are robust to alternative patent quality indicators.
Related Topics
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Authors
Francesco Venturini,