Article ID Journal Published Year Pages File Type
5134307 International Journal of Mass Spectrometry 2017 8 Pages PDF
Abstract

•In this article, the total and elastic cross sections for the SFx (x = 1-5) radicals by electron impact between 50 and 5000 eV are reported.•The electron-induced total ionization cross sections are reported in the energy range from ionization threshold to 5000 eV.•The present result agrees with the previous measurements, whenever available.•However, for many radicals, we estimated the total cross sections for the first time.•For these radicals, we also presented the calculated gas-kinetic radius and the van der Waals coefficient.

The spherical complex optical potential (SCOP) formalism is employed to solve the e−-SFx (x = 1-5) scattering system. In this article, the total cross sections by electron impact from 50 to 5000 eV are calculated. The complex scattering potential ionization contribution (CSP-ic) method is used to compute the electron-induced total ionization cross sections from the inelastic cross section in the energy range from ionization threshold to 5000 eV. For most of the reported radicals, the magnitude and shape of cross section compares well with previous measurements and calculations, wherever available. However, for many targets results are predicted for the first time in this work. From the electron-impact scattering cross sections for the SFx (x = 1-5) radicals, we also estimate the gas-kinetic radius and the van der Waals coefficient.

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Related Topics
Physical Sciences and Engineering Chemistry Analytical Chemistry
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