| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5184911 | Polymer | 2009 | 6 Pages |
Abstract
The inelastic mean free paths (IMFPs) of electrons at a poly[methyl(phenyl)silylene] thin film surface were determined using elastic peak electron spectroscopy (EPES) and Monte Carlo calculations for a wide electron energy range, 200-1600Â eV. We considered the surface composition determined from X-ray induced photoelectron spectra (XPS), the hydrogen concentration evaluated by EPES, and a correction for surface excitations. The results compare well to those calculated from the predictive TPP-2M and G1, formulae. Calculations carried out with the quantitative structure-property relationship of Cumpson and the formula of Ashley and Williams provide larger IMFP values, and can be useful only for a rough estimation.
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Related Topics
Physical Sciences and Engineering
Chemistry
Organic Chemistry
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Authors
J. Zemek, J. Houdkova, P. Jiricek, A. Jablonski, V. Jurka, J. Kub,