NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space

Near Edge X-ray Absorption Fine Structure (NEXAFS) spectromicroscopy, resonant scattering and resonant reflectivity are specialized, synchrotron radiation based, soft X-ray characterization tools that provide moiety-specific contrast and either real-space imaging at ∼30 nm spatial resolution, or scattering signals which can be inverted to provide chemically sensitive information at an even higher spatial resolution (<5 nm). These X-ray techniques complement other real and reciprocal space characterization tools such as various microscopies and conventional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based tools, describe their present state-of-the-art and discuss a number of applications to exemplify their unique aspects.