Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5185994 | Polymer | 2007 | 9 Pages |
Abstract
The crystalline morphology of poly(ethylene 2,6-naphthalate) (PEN) film obtained by uniaxial stretching at 145 °C (Tg + 25 °C) was investigated by use of a light scattering photometer equipped with a CCD camera system. The Hv scattering showed a symmetric, circular pattern at a low stretch ratio of λ < 3. The intensity profile became sharper with an increase in λ, suggesting that anisotropic crystal rods are randomly assembled and that the length of the rods increases with λ. At a high stretch ratio of λ â¥Â 3, a double-cross-type pattern consisting of a broad rod-like pattern and sharp cross streaks was observed. The rod-like pattern became smaller and the streaks became sharper with an increase in λ. By the model calculation of the scattering pattern, the double-cross-type pattern is explained by the stacking of anisotropic crystal rods oriented in the stretch direction. As λ increases, the thickness of the rods and the number per stack increase, and the stacks and rods are slightly oriented in the stretch direction. The change in the wide angle X-ray diffraction pattern suggested that the ordering of the molecular chain in the crystal rods increases with increasing λ.
Related Topics
Physical Sciences and Engineering
Chemistry
Organic Chemistry
Authors
Joo Young Nam, Mari Fukuoka, Hiromu Saito, Takashi Inoue,