Effects of substrate roughness on the orientation of cylindrical domains in thin films of a polystyrene-poly(methylmethacrylate) diblock copolymer studied using atomic force microscopy and cyclic voltammetry

Article ID	Journal	Published Year	Pages	File Type
5186018	Polymer	2009	8 Pages	PDF

Keywords

block copolymer atomic force microscopy Cyclic voltammetry

Related Topics

Physical Sciences and Engineering Chemistry Organic Chemistry

Effects of substrate roughness on the orientation of cylindrical domains in thin films of a polystyrene-poly(methylmethacrylate) diblock copolymer studied using atomic force microscopy and cyclic voltammetry

Authors

Helene C. Maire, Shaida Ibrahim, Yongxin Li, Takashi Ito,