Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5188982 | Polymer | 2006 | 6 Pages |
Abstract
In the present study, we apply a white light interferometric methodology to study sorption of moisture and methanol vapor in thin films of poly(2-hydroxyethyl methacrylate) [PHEMA] and poly(methyl methacrylate) [PMMA], supported on oxidized silicon wafers. The measured equilibrium thickness expansion of each film, exposed to different activities of the vapor penetrant, is used to determine the sorption isotherm of the system. Results for relatively thick films (100 nm < Lo < 600 nm) are compared with corresponding literature data for bulk, free-standing films, obtained by direct gravimetric methods. Furthermore, PMMA films of thicknesses lower than 100 nm were employed in order to study the effect of the dry film's thickness, and of substrate, on fractional swelling.
Related Topics
Physical Sciences and Engineering
Chemistry
Organic Chemistry
Authors
Kyriaki Manoli, Dimitris Goustouridis, Stavros Chatzandroulis, Ioannis Raptis, Evangelos S. Valamontes, Merope Sanopoulou,