Microcrystalline parameters in annealed Bivoltine silk fibres using wide-angle X-ray scattering

Wide-angle X-ray scattering studies of Bivoltine silk fibres have been carried out to obtain the crystal size distribution along the [201] direction. The minimum enthalpy for the formation of fibres has been estimated. The crystal size varies with annealing temperature, the values of g and α∗ remaining almost constant, which is a unique feature of Bivoltine silk fibre. Using paracrystalline statistics, the Laue pattern has been simulated employing the microstructural parameters reported in this paper.