Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5204868 | Polymer Degradation and Stability | 2006 | 7 Pages |
Abstract
Photon stimulated ion desorption (PSID) studies from poly(sulphone) (PS) have been carried out by using high-resolution time-of-flight mass spectrometry. Synchrotron radiation at the Brazilian Synchrotron Light Source (LNLS) operating in a single-bunch mode was used as excitation source. PS was excited at the sulphur 1s-edge and the desorption of small and large fragments has been observed. The results are discussed in terms of the X-ray induced electron stimulated desorption mechanism. The present results contrast with previous ones reported for poly(3-methylthiophene) (PMeT), in which the observation of S+ and S2+ was interpreted solely in terms of an Auger-stimulated ion desorption mechanism.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Organic Chemistry
Authors
D.E. Weibel, M.L.M. Rocco, F.C. Pontes, M. Ferreira, G.G.B. de Souza,