Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5204953 | Polymer Degradation and Stability | 2006 | 11 Pages |
Abstract
The Wear-out approach for lifetime prediction, based on cumulative damage concepts, is applied to several ethylene propylene rubber (EPR) cable insulation materials. EPR materials typically follow “induction-time” behavior in which their material properties change very slowly until just before failure, precluding the use of such time-dependent properties to predict failure. In the Wear-out approach, a material that has been aged at its ambient aging temperature Ta or at a low accelerated aging temperature is subsequently aged at a higher “Wear-out” temperature Tw in order to cause the material to reach its “failure” condition. In the simplest case, which involves the same chemical processes underlying degradation at Ta and Tw, a linear relationship is predicted between the time spent at Ta and the time required at Tw to complete the degradation. Data consistent with this expectation are presented for one of the EPR insulation materials. When the degradation chemistry at the two temperatures is different, a linear relationship between the time spent at Ta and the time required at Tw to complete the degradation is not generally expected. Even so, the Wear-out results for a second EPR material, which has evidence of changing chemistry, are reasonably linear and therefore useful from a predictive point-of-view. The Wear-out approach can therefore be used to transform non-predictive time-dependent material property results into predictive lifetime estimates. As a final example, the Wear-out approach is applied to an EPR insulation that had been aged in a nuclear power plant environment (â¼51 °C) for times up to 23 years to show its likely viability for the hundreds of years predicted at this aging temperature from accelerated aging tests on EPR insulation materials.
Related Topics
Physical Sciences and Engineering
Chemistry
Organic Chemistry
Authors
K.T. Gillen, M. Celina, R. Bernstein, M. Shedd,