Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5347311 | Applied Surface Science | 2017 | 25 Pages |
Abstract
Cross section SEM images of silicon nanowires prepared in etchant solution composed of 4% HF and 4.5% H2O2 for different etching time: A) 30Â min, B) 60Â min,C) 90Â mn, D) 180Â min, E)120Â min and F) 240Â min. J) Height of silicon nanowire versus time for three different H2O2 concentration.
Related Topics
Physical Sciences and Engineering
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Authors
Besma Moumni, Abdelkader Ben Jaballah,