Article ID Journal Published Year Pages File Type
5347534 Applied Surface Science 2017 15 Pages PDF
Abstract
In this work we investigate the chemical composition of an archetypal thin-film organic device with the Ag/LiF cathode using the time-of-flight secondary ion mass spectrometry (ToF-SIMS) with depth profiling. The LiF cathode underlayer is partly decomposed because a significant amount of lithium is released into the bulk of the multilayer device. The released lithium diffuses all the way to the substrate, accumulating, as revealed by ToF-SIMS depth profiles, at the interfaces rather than uniformly doping the underlying layers. Particularly, the bottom anode becomes chemically modified.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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