Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry

Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry

Alyssa Mock, Timothy Carlson, Jeremy VanDerslice, Joel Mohrmann, John A. Woollam, Eva Schubert, Mathias Schubert,