| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5349685 | Applied Surface Science | 2014 | 4 Pages |
Abstract
The chemical structures and the optical properties of the Ce-doped HfOxNy thin films were prepared by radio frequency (RF) magnetron sputtering and investigated by using X-ray photoelectron spectroscopy (XPS), ultraviolet-visible (UV-vis) absorption spectrophotometer and photoluminescence (PL) spectroscopy. The results showed that the band gap gradually decreased as the nitrogen incorporation content increased from 1.1% to 8.8%. The PL bands located at 380Â nm and 465Â nm of the sample as-deposited corresponded to the transition from the oxygen vacancy level to valance band and the 5d-4f transition of the trivalent cerium, respectively. The further study revealed that both two PL bands exhibited red shift phenomenon in the NH3-annealed sample, which is due to the decrease of the band gap.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Shuai Chen, Zhengtang Liu, Liping Feng, Tingting Tan, Xiaoru Zhao,