| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5349848 | Applied Surface Science | 2014 | 7 Pages |
Abstract
- Microstructure defects in crystalline silicon.
- Light beam induced photocurrent.
- Reversed bias voltage measurements on microscale.
- Thermal measurement allows identification of defect breakdown mechanism.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Pavel Å karvada, Pavel Tománek, Pavel Koktavý, Robert Macků, JiÅà Šicner, Marek Vondra, Dinara Dallaeva, Steve Smith, LubomÃr Grmela,