| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5349868 | Applied Surface Science | 2014 | 21 Pages |
Abstract
The polycrystalline character of the ZnO layer, inferred from the TEM images, was confirmed by the XRD pattern. The size of the crystallites evaluated from XRD measurements (application of Scherrer's formula) agreed with their size observed by TEM.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
J. Novák, P. Å utta, I. Vávra, P. EliáÅ¡, S. Hasenöhrl, A. LaurenÄÃková, I. Novotný,