| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5351274 | Applied Surface Science | 2017 | 5 Pages |
Abstract
We have grown tellurium (Te) thin films on Bi2Te3 and investigated the atomic structure. From low-energy electron diffraction (LEED) measurements, we found that the Te films are [101¯0]-oriented with six domains. A detailed analysis of the reflection high-energy electron diffraction (RHEED) pattern revealed that the films are strained with the in-plane lattice constant compressed by â¼1.5% compared to the bulk value due to the epitaxy between Te and Bi2Te3. These films will be interesting systems to investigate the predicted topological phases that occur in strained Te.
Related Topics
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Physical and Theoretical Chemistry
Authors
Yuma Okuyama, Yuya Sugiyama, Shin-ichiro Ideta, Kiyohisa Tanaka, Toru Hirahara,