Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5351383 | Applied Surface Science | 2014 | 5 Pages |
Abstract
We have investigated the valence electronic states of α-sexithiophene (α-6T) on three passivated Si(0 0 1) surfaces, oxidized Si(0 0 1), water-adsorbed Si(0 0 1) and ethylene-adsorbed Si(0 0 1), using ultraviolet photoelectron spectroscopy (UPS). At a thickness of α-6T layer below 0.5 nm, clear features of the Ï states are observed for water-adsorbed Si(0 0 1) and ethylene-adsorbed Si(0 0 1), whereas broad features are observed for oxidized Si(0 0 1). This difference is attributed to the formation of well-ordered stacking on water-adsorbed Si(0 0 1) and ethylene-adsorbed Si(0 0 1).
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Authors
K. Hiraga, H. Toyoshima, H. Tanaka, K. Inoue, S. Ohno, K. Mukai, J. Yoshinobu, M. Tanaka,