| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5351387 | Applied Surface Science | 2014 | 10 Pages |
Abstract
SEM cross-section micrograph of the silver doped ZnO thin films. The sample having the highest Ag/Zn atomic ratio of 0.04 presents a complete growth inhibition.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
P. Carvalho, P. Sampaio, S. Azevedo, C. Vaz, J.P. Espinós, V. Teixeira, J.O. Carneiro,