Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5351529 | Applied Surface Science | 2014 | 6 Pages |
Abstract
In this paper, Ti1âxAlxN/Ag/Ti1âxAlxN sandwich structure low-emissivity (Low-E) films were prepared by radio frequency reactive magnetron sputtering (RF-MS) on glass substrates. The morphology, chemical state and performance of the film system were characterized by FIB-SEM, XPS, FT-IR, UV-vis spectrophotometer and electrochemical workstation. The results showed that the multilayer films exhibit an excellent visible light transmittance (T% > 85% at λ = 550 nm) and remarkable high infrared reflectivity (R% > 96% in the 2.5 â¼Â 25 μm range). The Ti1âxAlxN dielectric-layer could not only increase transmittance in the visible light range of Ag film based on an anti-reflection effect, but also modify the intrinsic color of Ag film from sapphire to total color neutrality. In addition, Ti1âxAlxN layer could enhance the chemical stability of the Ag film. In principle, the approach to obtain Ti1âxAlxN/Ag/Ti1âxAlxN sandwich structure in our work could provide an alternative way to fabricate outstanding Low-E films.
Related Topics
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Authors
Jiamu Huang, Chengjie Xiang, Shaohui Li, Xiaoli Zhao, Guoqing He,