Article ID Journal Published Year Pages File Type
5351820 Applied Surface Science 2014 6 Pages PDF
Abstract

- The influence of two different locations of sputter guns on the morphological and structural properties of Cu-In-Ga precursors and Cu(In,Ga)Se2 (CIGS) thin films was investigated.
- Voids were observed at the CIGS/SLG interface of the CIGS films.
- Ordered vacancy compound (OVC) phase were observed in the CIGS films.
- The metallic precursors deposited with the upright-location sputter gun might be more appropriate to prepare CIGS thin films than those sputtered with the titled-location gun.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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