| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5352588 | Applied Surface Science | 2013 | 10 Pages |
Abstract
Titanium plane of TiO2 and oxygen plane of SiO2 overlapping in projection into xy plane. The number of overlapping atoms in both planes in xy projection is taken as a parameter characterizing compatibility of both structures.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
JonáÅ¡ Tokarský, Pavla Äapková,