| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5353193 | Applied Surface Science | 2016 | 14 Pages |
Abstract
- Atomic force microscopy (AFM) was developed to probe stem cell differentiation.
- The mechanical properties of stem cells and their ECMs can be used to clearly distinguish specific stem cell-differentiated lineages.
- AFM is a facile and useful tool for monitoring stem cell differentiation in a non-invasive manner.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Xiaobin Liang, Xuetao Shi, Serge Ostrovidov, Hongkai Wu, Ken Nakajima,