| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5353268 | Applied Surface Science | 2013 | 4 Pages |
Abstract
⺠Single phase Ba(Mg1/3Ta2/3)O3 and Ba(Zn1/3Ta2/3)O3 films grown by RF-PLD method on Pt-coated silicon substrates. ⺠Highly textured BXT thin films with cubic perovskite structure and low surface roughness were achieved. ⺠Unlike targets, the BXT films exhibit positive values of the temperature coefficient of the dielectric permittivity. ⺠BaMg1/3Ta2/3O3 and BaZn1/3Ta2/3O3 thin films with dielectric constant of about 22.5 and 25, respectively have been obtained.
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Authors
L. Nedelcu, N.D. Scarisoreanu, C. Chirila, C. Busuioc, M.G. Banciu, S.I. Jinga, M. Dinescu,