| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5353877 | Applied Surface Science | 2013 | 7 Pages |
Abstract
In the present work, CZTS thin films have been prepared by sulfurization of electrodeposited Cu-Zn-Sn (CZT) precursor. Prior to sulfurization, as-deposited CZT precursors have been soft annealed in Ar atmosphere at different temperatures (250-350 °C). The structural, morphological, compositional and optical properties of the films have been investigated in detail. It is found that, soft annealing temperature has a significant impact on the properties of CZTS thin films. The systematic study on the improvement in the properties of CZTS films using soft annealing route has been studied and discussed.
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Authors
K.V. Gurav, S.M. Pawar, Seung Wook Shin, M.P. suryawanshi, G.L. Agawane, P.S. Patil, Jong-Ha Moon, J.H. Yun, Jin Hyeok Kim,