| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5354356 | Applied Surface Science | 2015 | 6 Pages |
Abstract
- Light elements are visualized and identified using ABF and EELS-SI techniques.
- EELS-SI is used to obtain the elemental distribution at atomic resolution.
- ABF is applied to directly image the O atoms around the BTO-SRO interface.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
R.F. Negrea, V.S. Teodorescu, C. Ghica,