| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5354409 | Applied Surface Science | 2015 | 5 Pages |
Abstract
The phase-change performance of WxSb3Te material were systemically investigated by in situ resistance-temperature measurement, X-ray diffraction (XRD), Raman scattering, adhesive strength test and transmission electron microscope (TEM) in this paper. Experimental results show that the thermal stability of Sb3Te was increased significantly with W doping. XRD and TEM results prove that the incorporation of W plays a role in suppressing the crystallization of Sb3Te films, causing smaller grain size. Furthermore, the adhesive strength between W electrode and phase-change material was increased obviously by W addition and a relatively rapid SET/RESET operation of 10Â ns is realized with large sensing margin.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Yun Meng, Xilin Zhou, Peigao Han, Zhitang Song, Liangcai Wu, Chengqiu Zhu, Wenjing Guo, Ling Xu, Zhongyuan Ma, Lianke Song,