| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5354759 | Applied Surface Science | 2012 | 10 Pages |
Abstract
⺠Time of flight-secondary ion mass spectroscopy (TOF-SIMS) is a valuable tool for assessing the chemical aspects of the bone-implant interface. ⺠TOF-SIMS analysis could be done in combination with other techniques such as light and electron microscopy. ⺠Chemical and structural analysis from macro to nano could be achieved by combining different techniques. ⺠Sample preparation induce artifacts which has to be considered for each analysis.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Anders Palmquist, Lena Emanuelsson, Peter Sjövall,