| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5354973 | Applied Surface Science | 2013 | 6 Pages |
Abstract
Techniques were used to investigate about the patina composition and trace elements as a function of the sample depth obtained coupling XPS to 3Â keV argon ion sputtering technique.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
F. Caridi, L. Torrisi, M. Cutroneo, F. Barreca, C. Gentile, T. Serafino, D. Castrizio,