Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5355143 | Applied Surface Science | 2015 | 18 Pages |
Abstract
A novel technique for synthesis of high crystalline quality self-assembled InN nanorings, by nitriding the bulk deposited In/Si (5 5 3)-1 Ã 4 system using low energy N2+ ions at 520 °C, has been demonstrated. Scanning electron microscopy images reveal the formation of ring shaped InN structures with average size â¼500 nm. Anisotropic strain relaxation via self assembly could be the driving force for the formation of these InN rings on reconstructed Si (5 5 3) surface. High resolution X-ray diffraction analysis indicates high crystalline quality of these wurtzite InN nanostructures with c-plane. A strong downward band bending was observed in X-ray photoelectron spectroscopy valence band spectra which signify the large electron accumulation in the InN nanostructures.
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Authors
Amit Kumar Singh Chauhan, Mukesh Kumar, Govind Gupta,