Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5355461 | Applied Surface Science | 2011 | 5 Pages |
Abstract
⺠We applied Parrat's recursive model for constructing theoretical X-ray reflectivity of ZnO thin film. ⺠Independent information was exploited from Fourier transform of Fresnel reflectivity normalized experimental X-ray reflectivity. ⺠Optimization was established by constructing the error function describes discrepancy between reflectivities. ⺠Genetic algorithm optimization yielded structural parameters such as thickness, roughness and EDP of the film.
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Authors
Ghahraman Solookinejad, Amir Sayid Hassan Rozatian, Mohammad Hossein Habibi,