Article ID Journal Published Year Pages File Type
5355461 Applied Surface Science 2011 5 Pages PDF
Abstract
► We applied Parrat's recursive model for constructing theoretical X-ray reflectivity of ZnO thin film. ► Independent information was exploited from Fourier transform of Fresnel reflectivity normalized experimental X-ray reflectivity. ► Optimization was established by constructing the error function describes discrepancy between reflectivities. ► Genetic algorithm optimization yielded structural parameters such as thickness, roughness and EDP of the film.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Authors
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