| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5355567 | Applied Surface Science | 2016 | 9 Pages |
Abstract
- We investigate microstructural evolution of Ti2AlN MAX thin films with temperature.
- The film forms a mixture of Ti, Al and (Ti,Al)N cubic solid solution at 500 °C.
- The film nucleates into polycrystalline Ti2AlN Mn+1AXn phases at 600 °C.
- The film transforms into a single-crystalline Ti2AlN (0 0 0 2) thin film at 750 °C.
- The mechanisms behind Ti2AlN phase transformation with temperature are discussed.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Zheng Zhang, Hongmei Jin, Jianwei Chai, Jisheng Pan, Hwee Leng Seng, Glen Tai Wei Goh, Lai Mun Wong, Michael B. Sullivan, Shi Jie Wang,