Article ID Journal Published Year Pages File Type
5355601 Applied Surface Science 2016 10 Pages PDF
Abstract

- The surface modification layer improves symmetric geometry at the surface of atom probe tips.
- The compositional uniformities on the surface of oxide samples are enhanced.
- Step-wise APT analysis with TEM reveals the overall evaporation sequence on the surface of oxide samples during APT.
Keywords
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
Preview
Understanding of the field evaporation of surface modified oxide materials through transmission electron microscopy and atom probe tomography
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