| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5355732 | Applied Surface Science | 2011 | 8 Pages |
Abstract
⺠Organic phases trapped inside rocks may be accessed by ToF-SIMS depth profiling. ⺠To access the phases several micrometers of C60+ sputtering is needed. ⺠Sputtering induces topography and carbon deposition on the mineral surface. ⺠The topography is caused by chemical heterogeneities in the sample surface. ⺠The topography and carbon deposition do not affect the analysis of organic phases.
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Authors
S. Siljeström, J. Lausmaa, T. Hode, M. Sundin, P. Sjövall,