Segregation anisotropy of Sn on different crystallographic orientation surfaces of coarse-grained Zircaloy-4

X-ray photoelectron spectroscopy (XPS) technique was utilized to study the correlation between the tendency of Sn surface segregation and the crystallographic orientation of grain surface in coarse-grained (0.2-0.8 mm in diameter) Zircaloy-4 specimen. The results indicated that the intensity of Sn surface segregation was in an order of (0001)<(1¯21¯0)≈(011¯0), and it was in agreement with the prediction from bond-breaking theory.